Sequential Screening in Semiconductor Manufacturing, II: Exploiting Lot-to-Lot Variability

DOI10.1287/OPRE.44.1.196MaRDI QIDQ4883213zbMATH OpenOpenAlexFDO

Authors Jihong Ou, Lawrence M. Wein

Publication date 13 October 1996

Published in Operations Research (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1287/opre.44.1.196

zbMATH Keywords

screeningquality managementempirical Bayes approachbad chips

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Inventory, storage, reservoirs (90B05) Production models (90B30)

Recommendations

• Sequential Screening in Semiconductor Manufacturing, I: Exploiting Spatial Dependence
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• scientific article; zbMATH DE number 1740408
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Cited in

(6)

• Sequential Screening in Semiconductor Manufacturing, I: Exploiting Spatial Dependence
• Knowledge acquisition from batch semiconductor manufacturing data
• Optimal reduction of a spatial monitoring grid: proposals and applications in process control
• Designing repetitive screening procedures with imperfect inspections: an empirical Bayes approach
• Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing
• The effect of testing equipment shift on optimal decisions in a repetitive testing process

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