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scientific article; zbMATH DE number 1432382
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scientific article; zbMATH DE number 1432382 |
Statements
16 April 2000
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circuit
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test
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inaccuracy
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fault control
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Boolean function
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The author presents the further development of the method previously proposed by the author for transforming an arbitrary scheme (or a part of it) into an easily testable form. In contrast to one of the previous articles by the author [see \textit{V.~N.~Noskov}, Sib. Zh. Issled. Oper. 3, No. 1, 60-96 (1994; Zbl 0843.94024)], the class of basic elements does not contain only logical but also automatic functions. The class of permitted inaccuracies is reasonably large. The method transforms an arbitrary selected part \(S\) of a scheme into a scheme \(S'\) and does not change the remaining part. The scheme \(S'\) contains more inputs and outputs than the scheme \(S\) does. Testing makes it possible to diagnose inaccuracies from a given class of inaccuracies.
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