Lifetime prediction and failure analysis of IGBT module based on accelerated lifetime test (Q4980850)
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scientific article; zbMATH DE number 6311625
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| default for all languages | No label defined |
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| English | Lifetime prediction and failure analysis of IGBT module based on accelerated lifetime test |
scientific article; zbMATH DE number 6311625 |
Statements
30 June 2014
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accelerated lifetime test
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statistics and analysis
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lifetime distribution
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prediction model
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failure mechanism
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0.7329843640327454
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0.651861310005188
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0.6517292261123657
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0.6516355872154236
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0.6502396464347839
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