RTS noise in semiconductor devices: time constants estimates and observation window analysis (Q5078653)
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scientific article; zbMATH DE number 7531142
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| English | RTS noise in semiconductor devices: time constants estimates and observation window analysis |
scientific article; zbMATH DE number 7531142 |
Statements
RTS noise in semiconductor devices: time constants estimates and observation window analysis (English)
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23 May 2022
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current fluctuations
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fluctuation phenomena
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interfaces in random media
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noise models
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0.7259626388549805
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0.7133517861366272
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0.709282398223877
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0.6994870901107788
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