Failure probability estimation under additional subsystem information with application to semiconductor burn-in (Q5138591)
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scientific article; zbMATH DE number 7282078
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Failure probability estimation under additional subsystem information with application to semiconductor burn-in |
scientific article; zbMATH DE number 7282078 |
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Failure probability estimation under additional subsystem information with application to semiconductor burn-in (English)
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4 December 2020
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Bayes
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binomial distribution
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burn-in
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Clopper-Pearson
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serial system reliability
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