Failure probability estimation under additional subsystem information with application to semiconductor burn-in

DOI10.1080/02664763.2016.1189522OpenAlexW2395678455MaRDI QIDQ5138591FDOQ5138591

Authors: Daniel Kurz, Horst Lewitschnig, Jürgen Pilz 

Publication date: 4 December 2020

Published in: Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/02664763.2016.1189522

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zbMATH Keywords

binomial distributionBayesburn-inClopper-Pearsonserial system reliability

Mathematics Subject Classification ID

Statistics (62-XX)

Cites Work

• Interval estimation for a binomial proportion. (With comments and a rejoinder).
• Confidence intervals for a binomial proportion and asymptotic expansions
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• On Optimality Properties of the Power Prior
• Confidence Intervals for the Product of Two Binomial Parameters
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• Bayesian reliability
• Decision Theory
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• Lower Confidence Limits for Series System Reliability from Binomial Subsystem Data
• New results for computing Blaker's exact confidence interval for one parameter discrete distributions
• Bayesian estimation of functions of binomial rates

Cited In (3)

• Burn-in considering yield loss and reliability gain for integrated circuits
• An overview on recent advances in statistical burn-in modeling for semiconductor devices
• Early inference on reliability of upgraded automotive components by using past data and technical information

Uses Software

• GenBinomApps

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