scientific article; zbMATH DE number 1044019

DOI10.1002/(SICI)1520-6750(199702)44:1%3C127::AID-NAV8%3E3.0.CO;2-CzbMATH Open0882.90056MaRDI QIDQ4346871FDOQ4346871

Authors: Jen Tang, Kwei Tang, Herbert Moskowitz 

Publication date: 5 August 1997

Title of this publication is not available (Why is that?)

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zbMATH Keywords

system reliabilitylarge systemsubsystems

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

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• Failure probability estimation under additional subsystem information with application to semiconductor burn-in
• Bayesian reliability estimation for deteriorating systems with limited samples using the maximum entropy approach
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• Generalized beta prior models on fraction defective in reliability test planning
• How Errors in Component Reliability Affect System Reliability
• Generalized methods of system reliability estimation based on estimated component reliability
• Bayesian minimax estimates of systems reliability
• Estimating production test properties from test measurement data
• Bayesian nonparametric system reliability using sets of priors
• Convergence properties of an interval probabilistic approach to system reliability estimation
• Advances in data combination, analysis and collection for system reliability assessment
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• Optimal redesign decisions through failure rate estimates
• Inequality-based reliability estimates for complex systems

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