Development of tests for VLSI circuit testability at the upper design levels (Q544693)
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scientific article; zbMATH DE number 5908295
| Language | Label | Description | Also known as |
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| default for all languages | No label defined |
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| English | Development of tests for VLSI circuit testability at the upper design levels |
scientific article; zbMATH DE number 5908295 |
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Development of tests for VLSI circuit testability at the upper design levels (English)
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16 June 2011
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0.7526817917823792
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0.7421774864196777
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