Modification of upwind finite difference fractional step methods by the transient state of the semiconductor device (Q5451434)
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scientific article; zbMATH DE number 5254437
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| English | Modification of upwind finite difference fractional step methods by the transient state of the semiconductor device |
scientific article; zbMATH DE number 5254437 |
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Modification of upwind finite difference fractional step methods by the transient state of the semiconductor device (English)
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27 March 2008
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three-dimensional heat conduction
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fractional step
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optimal error estimates
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parallel upwind finite difference
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transient state of the semiconductor device
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0.8868234157562256
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0.8860601782798767
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0.8851681351661682
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0.8683034181594849
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