Modification of upwind finite difference fractional step methods by the transient state of the semiconductor device
DOI10.1002/NUM.20272zbMATH Open1157.82415OpenAlexW2129977569MaRDI QIDQ5451434FDOQ5451434
Authors: Yirang Yuan 
Publication date: 27 March 2008
Published in: Numerical Methods for Partial Differential Equations (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1002/num.20272
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optimal error estimatesfractional stepthree-dimensional heat conductionparallel upwind finite differencetransient state of the semiconductor device
Finite difference methods for initial value and initial-boundary value problems involving PDEs (65M06) Error bounds for initial value and initial-boundary value problems involving PDEs (65M15) Motion of charged particles (78A35) Statistical mechanics of semiconductors (82D37)
Cited In (10)
- Difference streamline diffusion method for three-dimensional semiconductor problem with heat-condution
- An upwind-block-centered finite difference method for a semiconductor device of heat conduction and its numerical analysis
- Characteristic finite difference fractional step methods for three-dimensional semiconductor device of heat conduction
- Upwind finite volume scheme for semiconductor device in three dimensions
- Modified upwind finite volume scheme for semiconductor device
- A block-centered upwind approximation of the semiconductor device problem on a dynamically changing mesh
- Finite difference fractional step methods for the transient behavior of a semiconductor device
- A mixed-finite volume element coupled with the method of characteristic fractional step difference for simulating transient behavior of semiconductor device of heat conductor and its numerical analysis
- Numerical method and analysis of computational fluid mechanics for photoelectric semiconducting detector
- Numerical method of mixed finite volume-modified upwind fractional step difference for three-dimensional semiconductor device transient behavior problems
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