Application and Reliability of Change-Point Analyses for Detecting a Defective Stage in Integrated Circuit Manufacturing (Q5481633)

From MaRDI portal

!

This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use the normal view instead:

scientific article; zbMATH DE number 5044983
Language Label Description Also known as
default for all languages
No label defined
    English
    Application and Reliability of Change-Point Analyses for Detecting a Defective Stage in Integrated Circuit Manufacturing
    scientific article; zbMATH DE number 5044983

      Statements

      Application and Reliability of Change-Point Analyses for Detecting a Defective Stage in Integrated Circuit Manufacturing (English)
      0 references
      10 August 2006
      0 references
      bagging
      0 references
      change-point analysis
      0 references
      Markov chain Monte Carlo
      0 references
      optimal segmentation
      0 references
      quality control
      0 references

      Identifiers

      0 references
      0 references
      0 references
      0 references
      0 references
      0 references
      0 references