Application and Reliability of Change-Point Analyses for Detecting a Defective Stage in Integrated Circuit Manufacturing
DOI10.1080/03610910600591602zbMATH Open1099.62134OpenAlexW2086500682MaRDI QIDQ5481633FDOQ5481633
Authors:
Publication date: 10 August 2006
Published in: Communications in Statistics. Simulation and Computation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610910600591602
Recommendations
- Utilizing simulation to develop economic equipment selection and sampling plans for integrated circuit manufacturing
- A review of yield modelling techniques for semiconductor manufacturing
- Monitoring Wafer Map Data from Integrated Circuit Fabrication Processes for Spatially Clustered Defects
- Detection of an unreliable element in a flexible manufacturing system
- scientific article; zbMATH DE number 872143
Applications of Markov chains and discrete-time Markov processes on general state spaces (social mobility, learning theory, industrial processes, etc.) (60J20) Bayesian inference (62F15) Applications of statistics in engineering and industry; control charts (62P30) Numerical analysis or methods applied to Markov chains (65C40) Signal detection and filtering (aspects of stochastic processes) (60G35)
Cites Work
- Title not available (Why is that?)
- Reversible jump Markov chain Monte Carlo computation and Bayesian model determination
- Title not available (Why is that?)
- Using penalized contrasts for the change-point problem
- Automatic Bayesian Curve Fitting
- Monte Carlo sampling methods using Markov chains and their applications
Cited In (2)
This page was built for publication: Application and Reliability of Change-Point Analyses for Detecting a Defective Stage in Integrated Circuit Manufacturing
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q5481633)
