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scientific article; zbMATH DE number 4187723
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| English | No label defined |
scientific article; zbMATH DE number 4187723 |
Statements
1990
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computer-aided design of testable combinational logic circuits
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decomposition algorithms
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test set generation
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test pattern generation
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fault simulation
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0.7824852466583252
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0.7791886329650879
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0.7699259519577026
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