Partitioning circuits for improved testability (Q920939)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Partitioning circuits for improved testability |
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Partitioning circuits for improved testability (English)
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1991
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VLSI circuits
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dynamic programming
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NP-completeness
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self-testing of combinational circuitry
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level-sensitive scan design
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combinational logic
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unconstrained partitioning problem
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