Strong test ideals (Q5957777)

Test ideals are a notion introduced by \textit{M. Hochster} and \textit{C. Huneke} [J. Am. Math. Soc. 3, 31-116 (1990; Zbl 0701.13002)], and are a powerful tool in the theory of tight closure. Strong test ideals are, as expected, even stronger, and were introduced by \textit{C. Huneke} [J. Pure Appl. Algebra, 11, 243-250 (1997; Zbl 0898.13003)] as follows: A test ideal of a ring \(R\) is an ideal \(J\) not contained in any minimal prime ideal of \(R\) such that for any ideal \(I\) in \(R\), \(JI = JI^*\), where \(I^*\) denotes the tight closure of \(I\). Some existence cases were proved in the paper cited above. In the paper under review the author proves the existence of strong test ideals for any complete local ring in positive prime characteristic, and more generally for any Noetherian local ring in positive prime characteristic for which test ideal commutes with localization. Strong test ideals are not uniquely defined, and the author shows that it may be beneficial to work with more than one test ideal. The last sections of this paper show several constructions of strong test ideals and of tightly closed ideals.