Failure probability estimation with differently sized reference products for semiconductor burn-in studies (Q6574671)
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scientific article; zbMATH DE number 7883185
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| English | Failure probability estimation with differently sized reference products for semiconductor burn-in studies |
scientific article; zbMATH DE number 7883185 |
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Failure probability estimation with differently sized reference products for semiconductor burn-in studies (English)
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18 July 2024
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area scaling
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binomial distribution
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burn-in
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combinatorics
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semiconductor reliability
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