Failure probability estimation with differently sized reference products for semiconductor burn-in studies

DOI10.1002/ASMB.2100MaRDI QIDQ6574671zbMATH OpenFDO

Authors Daniel Kurz, Horst Lewitschnig, Jürgen Pilz

Publication date 18 July 2024

Published in Applied Stochastic Models in Business and Industry (Search for Journal in Brave)

zbMATH Keywords

binomial distributioncombinatoricsburn-inarea scalingsemiconductor reliability

Mathematics Subject Classification ID

Statistics (62-XX)

Cites work

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• scientific article; zbMATH DE number 3591262 (Why is no real title available?)
• scientific article; zbMATH DE number 3065425 (Why is no real title available?)
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