Failure probability estimation with differently sized reference products for semiconductor burn-in studies

DOI10.1002/ASMB.2100MaRDI QIDQ6574671FDOQ6574671

Authors: Daniel Kurz, Horst Lewitschnig, Jürgen Pilz 

Publication date: 18 July 2024

Published in: Applied Stochastic Models in Business and Industry (Search for Journal in Brave)

zbMATH Keywords

binomial distributioncombinatoricsburn-inarea scalingsemiconductor reliability

Mathematics Subject Classification ID

Statistics (62-XX)

Cites Work

• Interval estimation for a binomial proportion. (With comments and a rejoinder).
• Confidence intervals for a binomial proportion and asymptotic expansions
• Title not available (Why is that?)
• Robust statistical modeling using the Birnbaum‐Saunders‐t distribution applied to insurance
• Title not available (Why is that?)
• On Prior Distributions for Binary Trials
• Title not available (Why is that?)
• On Optimality Properties of the Power Prior
• Constructions and applications of lifetime distributions
• Bayesian reliability
• Decision Theory
• The use of confidence of fiducial limits illustrated in the case of the binomial.
• Bounds to optimal burn-in and optimal work size
• Data analytics and stochastic modelling in a semiconductor fab
• Diagnostics in Birnbaum-Saunders accelerated life models with an application to fatigue data
• Industrial statistics applications in the semiconductor industry: some examples

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