Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology (Q6670697)
From MaRDI portal
| This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology |
scientific article; zbMATH DE number 7974266
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology |
scientific article; zbMATH DE number 7974266 |
Statements
Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology (English)
0 references
24 January 2025
0 references
light scattering
0 references
rigorous model
0 references
electric field
0 references
Maxwell's equation
0 references
0 references
0.6829236745834351
0 references
0.6724945902824402
0 references
0.6696486473083496
0 references
0.6621593832969666
0 references
0.656049907207489
0 references