Comparison of rigorous scattering models to accurately replicate the behaviour of scattered electromagnetic waves in optical surface metrology
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Publication:6670697
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Cites work
- scientific article; zbMATH DE number 1516880 (Why is no real title available?)
- scientific article; zbMATH DE number 3186688 (Why is no real title available?)
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- \(T\)- and \(D\)-matrix methods for electromagnetic scattering by impedance obstacles
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