Generalized test ideals and symbolic powers (Q841563)

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Generalized test ideals and symbolic powers
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    Generalized test ideals and symbolic powers (English)
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    17 September 2009
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    The authors use properties of the test ideal to prove bounds o the growth of symbolic powers of ideals in rings of equal characteristic. These results improve results of \textit{M. Hochster} and \textit{C. Huneke} [Ill. J. Math. 51, No. 1, 171--183 (2007; Zbl 1127.13005)] (also see [Invent. Math. 147, No. 2, 349--369 (2002; Zbl 1061.13005)]). For example, the following result is proven: Theorem 3.1. Let \((R, \mathfrak{m})\) be an excellent regular local ring of positive characteristic and let \(I\) be a non-zero proper ideal. Set \(h\) to be the largest analytic spread of \(I R_P\) as \(P\) runs through the associated primes of \(I\). Then for all \(n \geq 1\) and \(k \geq 0\) we have \[ I^{(hn + kn + 1)} \subseteq \mathfrak{m} (I^{(k+1)})^n. \] Additional stronger results when one assumes that \(R/I\) is \(F\)-pure (see Theorem 3.3) in the text. The method of proof is mostly via test ideals associated to graded systems of symbolic powers of ideals (which at least philosophically is closely related to proofs of related results found in [\textit{L. Ein, R. Lazarsfeld} and \textit{K. E. Smith}, Invent. Math. 144, 241--252 (2001; Zbl 1076.13501)]). These results are also lifted to characteristic zero (although in one case, a direct proof using multiplier ideals is obtained). Finally, the authors also prove that the formation of these test ideal variants commutes with localization at least assuming that \(R\) is Gorenstein (although \textit{not} assuming that \(R\) is \(F\)-finite).
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    symbolic power
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    test ideal
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    graded system of ideals
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    tight closure
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    multiplier ideals
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