Spatial filtering of the diffraction field of a double-exposure hologram of a focused scatterer image. II (Q944100)

The paper is devoted to the study of the interferometer sensitivity to transverse or longitudinal displacements of a diffusively scattering surface under double-exposure recording of a focused image hologram. The distribution of the complex field amplitude is considered to result from two Fourier transforms of the distribution in the object plane. The author shows that: (i) the interference patterns are localized in two planes (with each plane characterized by different interferometer sensitivity), in the case of transverse displacement of the scatterer; (ii) the interference pattern is localized in one plane, in the case of control of the longitudinal displacement (being in such case necessary to perform spatial filtering of the diffraction field in the hologram plane). Part I, see Russ. Phys. J. 50, No. 8, 765--775 (2007; Zbl 1176.78008).