A sequential fluid-solid weak coupling analysis of the SPE in stressed Si layers (Q987056)
From MaRDI portal
!
This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use the normal view instead:
scientific article; zbMATH DE number 5769721
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | A sequential fluid-solid weak coupling analysis of the SPE in stressed Si layers |
scientific article; zbMATH DE number 5769721 |
Statements
A sequential fluid-solid weak coupling analysis of the SPE in stressed Si layers (English)
0 references
12 August 2010
0 references
solid phase epitaxy
0 references
fluid-solid interaction
0 references
crystal growth
0 references
interface growth instability
0 references
0.9447751045227052
0 references
0.6835417747497559
0 references
0.6800115704536438
0 references
0.6765321493148804
0 references
