Localization operator based on sampling multipliers

DOI10.1016/J.ACHA.2006.07.001MaRDI QIDQ869651zbMATH OpenOpenAlexFDO

Authors Liwen Qian

Publication date 8 March 2007

Published in Applied and Computational Harmonic Analysis (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/j.acha.2006.07.001

zbMATH Keywords

error estimateHermite functionlocalization operatorMeyer waveletsampling multiplier

Mathematics Subject Classification ID

Approximation by operators (in particular, by integral operators) (41A35) Algorithms for approximation of functions (65D15)

Review text

The paper studies the localization operator based on sampling multipliers. The obtained explicit error bounds for approximation in the Paley-Wiener spaces unify several extensions of the Shannon sampling theorem and generalize the localized sampling with special sampling multipliers. By applying the Hermite multiplier in the localized sampling series, exponentially decaying accuracy can be achieved for approximating functions and their derivatives in Paley-Wiener spaces, and practical means for choosing parameters to achieve any desired accuracy for sampling is provided. The localized sampling series significantly improves the convergence rate of sampling expansion in Mayer wavelet subspaces when the Hermite multipliers are used. Numerical experiments are presented to demonstrate the high accuracy performed by using the localized sampling series.

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Cited in

(7)

• Optimal learning of bandlimited functions from localized sampling
• Convolutions for localization operators
• Sharp exponential bounds for the Gaussian regularized Whittaker-Kotelnikov-Shannon sampling series
• Localized sampling in the presence of noise
• Localization results for the non-truncated max-product sampling operators based on Fejér and sinc-type kernels
• The near-equivalence of five species of spectrally-accurate radial basis functions (RBFs): Asymptotic approximations to the RBF cardinal functions on a uniform, unbounded grid
• Local error estimation for sampling problems

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