Material Degradation Modeling and Failure Prediction Using Microstructure Images

DOI10.1080/00401706.2018.1514327MaRDI QIDQ6621640zbMATH OpenFDO

Authors Wujun Si, Qingyu Yang, Xin Wu

Publication date 18 October 2024

Published in Technometrics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/00401706.2018.1514327

Mathematics Subject Classification ID

Applications of statistics (62Pxx)

Cites work

• A smoothed finite element method for plate analysis
• Asymptotic optimality of \(C_ L\) and generalized cross-validation in ridge regression with application to spline smoothing
• Covariates and random effects in a Gamma process model with application to degradation and failure
• Estimation in degradation models with explanatory variables
• Functional additive regression
• Functional data analysis.
• Functional linear regression analysis for longitudinal data
• Functional linear regression via canonical analysis
• Gaussian Markov Random Fields
• scientific article; zbMATH DE number 47282 (Why is no real title available?)
• Joint modeling of degradation and failure time data
• Linear functional regression: The case of fixed design and functional response
• Maximum penalized likelihood estimation in a Gamma-frailty model
• Models for Variable-Stress Accelerated Life Testing Experiments Based on Wiener Processes and the Inverse Gaussian Distribution
• Nonlinear general path models for degradation data with dynamic covariates
• Stochastic generation of explicit pore structures by thresholding Gaussian random fields
• Using Degradation Measures to Estimate a Time-to-Failure Distribution

Cited in

(1)

• A Periodic Fractional Wiener Process for Remaining Useful Life Prediction of Photovoltaic Systems with Long-Range Dependence

This page was built for publication: Material Degradation Modeling and Failure Prediction Using Microstructure Images

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q6621640)