Multilayer Perceptron with Functional Inputs: an Inverse Regression Approach
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Abstract: Functional data analysis is a growing research field as more and more practical applications involve functional data. In this paper, we focus on the problem of regression and classification with functional predictors: the model suggested combines an efficient dimension reduction procedure [functional sliced inverse regression, first introduced by Ferr'e & Yao (Statistics, 37, 2003, 475)], for which we give a regularized version, with the accuracy of a neural network. Some consistency results are given and the method is successfully confronted to real-life data.
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Cited in
(18)- Functional \(k\)-means inverse regression
- Functional data analysis in shape analysis
- Fast \(DD\)-classification of functional data
- Functional multi-layer perceptron: A nonlinear tool for functional data analysis
- Connection between multilayer perceptrons and regression using independent component analysis
- Kernel sliced inverse regression: regularization and consistency
- No effect tests in regression on functional variable and some applications to spectrometric studies
- Supervised classification for a family of Gaussian functional models
- A Bayesian hierarchical model for classification with selection of functional predictors
- Functional linear regression after spline transformation
- scientific article; zbMATH DE number 1928691 (Why is no real title available?)
- Nonstationary Gaussian Process Discriminant Analysis With Variable Selection for High-Dimensional Functional Data
- Neural networks for scalar input and functional output
- Interpretable sparse SIR for functional data
- Multiclass functional discriminant analysis and its application to gesture recognition
- Two-layer neural network on infinite-dimensional data: global optimization guarantee in the mean-field regime
- Hippocampal shape analysis in Alzheimer's disease using functional data analysis
- Functional classification of ornamental stone using machine learning techniques
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