New-age: A negative bias temperature instability-estimation framework for microarchitectural components

DOI10.1007/S10766-009-0104-YMaRDI QIDQ839019zbMATH OpenOpenAlexFDO

Authors Michael DeBole, Ramakrishnan Krishnan, Varsha Balakrishnan, Wenping Wang, Hong Luo, Yu Wang, Yuan Xie, Yu Cao, Narayanan Vijaykrishnan

Publication date 1 September 2009

Published in International Journal of Parallel Programming (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/s10766-009-0104-y

zbMATH Keywords

microprocessor reliabilityNBTI frameworknegative bias temperature instabilityreliable systems

Mathematics Subject Classification ID

Computer system organization (68M99)

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