New generalization of process capability index Cpk

DOI10.1080/02664769822783MaRDI QIDQ4269562zbMATH OpenOpenAlexFDO

Authors Wen Lea Pearn, Kuen-Suan Chen

Publication date 1998

Published in Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/02664769822783

zbMATH Keywords

process capabilityquality control

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30)

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Cites work

• A bayesian-like estimator of c_pk
• Brocess capability with asymmetric tolerances
• Some Process Capability Indices are More Reliable than One Might Think

Cited in

(21)

• Assessing process capability based on the lower confidence bound of \(C_{pk}\) for asymmetric tolerances
• Performance evaluation of processes with asymmetric tolerances in the presence of gauge measurement errors
• Capability indices for Birnbaum-Saunders processes applied to electronic and food industries
• Process Yield and Capability Indices
• New capability indices for non normal processes
• On Confidence Intervals for Process Capability Indices in a One-Way Random Model
• Properties of estimators of the process capability index \(C^{\prime\prime}_{pk}\)
• A Hypothesis Testing Procedure on Assessing Process Performance for Asymmetric Tolerances
• Measuring Process Performance Based on Expected Loss with Asymmetric Tolerances
• Process capability analysis for an entire product
• On a Process Capability Index for Asymmetric Specifications
• Estimating capability index c_pkfor processes with asymmetric tolerances
• Estimating Process Capability Indices Based on Subsamples for Asymmetric Tolerances
• A note on the interval estimation of c_{pk} with asymmetric tolerances
• A mixed double sampling plan based on \(C_{pk} \)
• A new control chart using GINI C_PK
• Measuring process capability index C_pkwith fuzzy data
• Distributions of the Estimated Process Capability Index Cpk
• Unification of some multivariate process capability indices for asymmetric specification region
• Process capability analysis for bounded measurements via the \(S_{p m k}\) index
• The \({C}_{pk}\) index for asymmetric tolerances: Implications and inference

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