Nonparametric permutation and combination-based multivariate control charts with applications in microelectronics

DOI10.1002/ASMB.1976MaRDI QIDQ6570836zbMATH OpenFDO

Authors Livio Corain, Luigi Salmaso

Publication date 10 July 2024

Published in Applied Stochastic Models in Business and Industry (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1002/ASMB.1976

zbMATH Keywords

finite-sample consistencymultivariate testsnonparametric combinationNPC chart

Mathematics Subject Classification ID

Statistics (62-XX)

Cites work

• A bi-aspect nonparametric test for the multi-sample location problem
• A bi-aspect nonparametric test for the two-sample location problem
• A Multivariate Exponentially Weighted Moving Average Control Chart
• Finite-sample consistency of combination-based permutation tests with application to repeated measures designs
• scientific article; zbMATH DE number 3962977 (Why is no real title available?)
• Multiple aspect testing for case-control designs
• Multivariate Bi-Aspect Testing for the Two-Sample Location Problem
• Multivariate Generalizations of Cumulative Sum Quality-Control Schemes
• Multivariate tri-aspect non-parametric testing
• Permutation tests for stochastic ordering and ANOVA. Theory and applications with \(\mathtt R\)
• Power of the Noncentral F-Test: Effect of Additional Variates on Hotelling's T 2 -Test
• Randomization tests. With CD-ROM.
• Simulating multivariate nonnormal distributions
• The Large-Sample Power of Tests Based on Permutations of Observations

Cited in

(1)

• Modeling and analyzing semiconductor yield with generalized linear mixed models

This page was built for publication: Nonparametric permutation and combination-based multivariate control charts with applications in microelectronics

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q6570836)