Modeling and analyzing semiconductor yield with generalized linear mixed models

DOI10.1002/ASMB.2074MaRDI QIDQ6571878zbMATH OpenFDO

Authors D. C. Krueger, Douglas C. Montgomery

Publication date 12 July 2024

Published in Applied Stochastic Models in Business and Industry (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1002/ASMB.2074

zbMATH Keywords

big datageneralized linear mixed modelsgeneralized linear modelsGLMGLMMsemiconductor yield modeling

Mathematics Subject Classification ID

Statistics (62-XX)

Cites work

• A review of yield modelling techniques for semiconductor manufacturing
• Approximate Inference in Generalized Linear Mixed Models
• Determining the target value of ACICD to optimize the electrical characteristics of semiconductors using dual response surface optimization
• Generalized linear mixed models a pseudo-likelihood approach
• Generalized linear mixed models: a review and some extensions
• Generalized linear models. With applications in engineering and the sciences.
• scientific article; zbMATH DE number 47310 (Why is no real title available?)
• Introduction to general and generalized linear models.
• Introduction to linear regression analysis.
• Mixed response surface models and Bayesian analysis of variance components for electrically conductive adhesives
• Monitoring Wafer Map Data from Integrated Circuit Fabrication Processes for Spatially Clustered Defects
• Nonparametric permutation and combination-based multivariate control charts with applications in microelectronics
• Statistics for microelectronics
• Validation and evaluation for defect-kill-rate and yield estimation models in semiconductor manufacturing

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