On the use of counters for reproducing deterministic test sets

DOI10.1109/12.545970MaRDI QIDQ4420787zbMATH OpenOpenAlexFDO

Authors Dimitrios Kagaris, S. Tragoudas, A. Majumdar

Publication date 1996

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/12.545970

zbMATH Keywords

binary counterbinary matrix column perturbationtest pattern generation

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

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(9)

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