Probabilistic design of systems with general distributions of parameters

DOI10.1002/CTA.173MaRDI QIDQ4539888zbMATH OpenOpenAlexFDO

Authors K. Ponnambalam, Abbas Seifi, Jiri Vlach

Publication date 11 July 2002

Published in International Journal of Circuit Theory and Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1002/cta.173

zbMATH Keywords

Monte Carlo simulationscalingstochastic uncertaintytolerance design

Mathematics Subject Classification ID

Monte Carlo methods (65C05) Design techniques (robust design, computer-aided design, etc.) (93B51)

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Cites work

• Stochastic optimization in system design

Cited in

(19)

• Inference of progressively censored competing risks data from Kumaraswamy distributions
• The exponentiated Kumaraswamy distribution and its log-transform
• Statistical analysis for Kumaraswamy's distribution based on record data
• Probabilistic optimization of engineering system with prescribed target design in a reduced parameter space
• Reliability inference for a multicomponent stress-strength model based on Kumaraswamy distribution
• Inference for the Kumaraswamy distribution under \(k\)-record values
• The use of stochastic analytic center for yield maximization of systems with general distributions of component values
• On the Marshall-Olkin extended distributions
• Bivariate Kumaraswamy distribution: properties and a new method to generate bivariate classes
• Inference on the Kumaraswamy distribution
• Optimization of filter designs with dependent and asymmetrically distributed parameters
• Probabilistic tolerance design for a subsystem under burr distribution using taguchi's loss functions
• Yield estimation for efficient design centring assuming arbitrary statistical distributions
• Inference for Kumaraswamy distribution under type-I generalized hybrid censoring
• Improved point estimation for the Kumaraswamy distribution
• Inference for dependent competing risks from bivariate Kumaraswamy distribution under generalized progressive hybrid censoring
• Maximization of manufacturing yield of systems with arbitrary distributions of component values
• Kumaraswamy distribution: different methods of estimation
• Classical and Bayesian estimation of \(P(X<Y)\) using upper record values from Kumaraswamy's distribution

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