Yield estimation for efficient design centring assuming arbitrary statistical distributions

DOI10.1002/CTA.4490060306MaRDI QIDQ4168873zbMATH OpenOpenAlexFDO

Authors H. L. Abdel-Malek, John W. Bandler

Publication date 1978

Published in International Journal of Circuit Theory and Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1002/cta.4490060306

zbMATH Keywords

efficient design centeringstatistical distributions

Mathematics Subject Classification ID

Monte Carlo methods (65C05) Estimation and detection in stochastic control theory (93E10) Analytic circuit theory (94C05) Applications of design theory to circuits and networks (94C30)

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Cites work

• scientific article; zbMATH DE number 3193312 (Why is no real title available?)
• Optimization of design tolerances using nonlinear programming

Cited in

(8)

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• The use of stochastic analytic center for yield maximization of systems with general distributions of component values
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• Optimization of electrical circuits
• Optimization of filter designs with dependent and asymmetrically distributed parameters
• Probabilistic design of systems with general distributions of parameters
• Maximization of manufacturing yield of systems with arbitrary distributions of component values

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