A defect localization scheme for cellular nanocomputers

DOI10.1007/s00354-008-0056-6zbMath1193.68167OpenAlexW1964579231MaRDI QIDQ1031922

Teijiro Isokawa, Naotake Kamiura, Ferdinand Peper, Nobuyuki Matsui, Shin'ya Kowada

Publication date: 23 October 2009

Published in: New Generation Computing (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s00354-008-0056-6

zbMATH Keywords

cellular automatabiased random walkasynchronousnanotechnologydefect tolerance

Mathematics Subject Classification ID

Cellular automata (computational aspects) (68Q80)

Cites Work

• Unnamed Item
• Automata and concurrency
• Defect-tolerance in cellular nanocomputers
• Online Marking of Defective Cells by Random Flies
• FAULT-TOLERANT NANOCOMPUTERS BASED ON ASYNCHRONOUS CELLULAR AUTOMATA
• Self-Timed Cellular Automata and their computational ability

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