Estimation of the test completeness of devices with analog controllable parameters

MaRDI QIDQ1287613zbMATH OpenFDO

Authors Yu. V. Malyshenko

Publication date 2 March 2000

Published in Automation and Remote Control (Search for Journal in Brave)

zbMATH Keywords

estimation of the test completenessfaults

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Observability (93B07) Estimation and detection in stochastic control theory (93E10) Fault detection; testing in circuits and networks (94C12)

Recommendations

• scientific article; zbMATH DE number 2169470
• scientific article; zbMATH DE number 2065127
• Improved analogue fault coverage estimation using probabilistic analysis
• Methods of testability analysis for digital logic
• Reliability of compact testing methods

Cited in

(2)

• Exhaustive testing of almost all devices with outputs depending on limited number of inputs
• Finding of optimal excitation signal for testing of analog electronic circuits

This page was built for publication: Estimation of the test completeness of devices with analog controllable parameters

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q1287613)