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Estimation of the test completeness of devices with analog controllable parameters

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Publication:1287613
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zbMATH Open0931.93010MaRDI QIDQ1287613FDOQ1287613


Authors: Yu. V. Malyshenko Edit this on Wikidata


Publication date: 2 March 2000

Published in: Automation and Remote Control (Search for Journal in Brave)





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zbMATH Keywords

faultsestimation of the test completeness


Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Observability (93B07) Estimation and detection in stochastic control theory (93E10) Fault detection; testing in circuits and networks (94C12)



Cited In (2)

  • Exhaustive testing of almost all devices with outputs depending on limited number of inputs
  • Finding of optimal excitation signal for testing of analog electronic circuits





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