scientific article; zbMATH DE number 2065127

MaRDI QIDQ4459790zbMATH OpenFDO

Authors Michael Pronath, Helmut Graeb, Kurt J. Antreich

Publication date 18 May 2004

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Recommendations

• Improved analogue fault coverage estimation using probabilistic analysis
• Automatic test generation techniques for analog circuits and systems: A review
• Functional fault models for analog circuit elements
• Digital to analog converter nonlinear test
• A classical parameter identification method and a modern test generation algorithm

Cited in

(4)

• Estimation of the test completeness of devices with analog controllable parameters
• Digital to analog converter nonlinear test
• Improved analogue fault coverage estimation using probabilistic analysis
• Finding of optimal excitation signal for testing of analog electronic circuits

Describes a project that uses

Uses Software

• PASTA

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