A classical parameter identification method and a modern test generation algorithm

DOI10.1007/S00034-010-9228-YzbMATH Open1205.94140OpenAlexW2010990702MaRDI QIDQ626403FDOQ626403

Authors: Ting Long, Houjun Wang, Bing Long 

Publication date: 18 February 2011

Published in: Circuits, Systems, and Signal Processing (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s00034-010-9228-y

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zbMATH Keywords

tolerancesensitivity analysistest generationcomponent connection model (CCM)faulty diagnosis

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cites Work

• Automatic test generation algorithms for analogue circuits
• Hierarchical fault diagnosis of analog integrated circuits

Cited In (1)

• Title not available (Why is that?)

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