A classical parameter identification method and a modern test generation algorithm

DOI10.1007/S00034-010-9228-YMaRDI QIDQ626403zbMATHOpenAlexFDO

Authors Ting Long, Houjun Wang, Bing Long

Publication date 18 February 2011

Published in Circuits, Systems, and Signal Processing (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/s00034-010-9228-y

zbMATH Keywords

tolerancesensitivity analysistest generationcomponent connection model (CCM)faulty diagnosis

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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Cites work

• Automatic test generation algorithms for analogue circuits
• Hierarchical fault diagnosis of analog integrated circuits

Cited in

(1)

• scientific article; zbMATH DE number 2065127 (Why is no real title available?)

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