Algebraic method for fault diagnosis and parametric identification of analog circuits
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Publication:3131507
DOI10.11990/JHEU.201601083zbMATH Open1389.94130MaRDI QIDQ3131507FDOQ3131507
Authors:
Publication date: 29 January 2018
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Cited In (12)
- Fault diagnosis for analog circuits with tolerance based on circuit feature information matrix
- Fault diagnosis method for analog circuits based on matrix perturbation analysis
- Finding ambiguity groups in low testability analog circuits
- An algebraic diagnostic method for symmetric function circuitry
- A theory and an algorithm for analog circuit fault diagnosis
- A method for fault diagnosis in linear electronic circuits
- Minimization of ambiguity in parametric fault diagnosis of analog circuits: a complex network approach
- A classical parameter identification method and a modern test generation algorithm
- An algorithm for fault location and parameter identification of analog circuits based on interval arithmetics
- A search algorithm for the solution of the multifrequency fault diagnosis equations
- Algebraic Approach to Ambiguity-Group Determination in Nonlinear Analog Circuits
- Parametric fault diagnosis of analog circuits based on a semi-supervised algorithm
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