Provably good pattern generators for a random pattern test

DOI10.1007/BF01293265zbMath0791.94017OpenAlexW2913655692MaRDI QIDQ1322559

Thomas H. Spencer

Publication date: 24 July 1994

Published in: Algorithmica (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/bf01293265

zbMATH Keywords

combined circuitspseudorandom pattern generatorrandom pattern test

Mathematics Subject Classification ID

Hardware implementations of nonnumerical algorithms (VLSI algorithms, etc.) (68W35) Fault detection; testing in circuits and networks (94C12) Random number generation in numerical analysis (65C10) Reliability, testing and fault tolerance of networks and computer systems (68M15)

Related Items (4)

A combinatorial error bound for \(t\)-point-based sampling ⋮ A simple analysis of the error probability of two-point based sampling ⋮ Realistic analysis of some randomized algorithms ⋮ Provably good pattern generators for a random pattern test

Cites Work

• On the power of two-point based sampling
• Bonferroni inequalities
• Universal classes of hash functions
• Provably good pattern generators for a random pattern test
• How to Generate Cryptographically Strong Sequences of Pseudorandom Bits
• On the discrepancy of GFSR pseudorandom numbers
• Generalized Bonferroni inequalities
• Methods for Proving Bonferroni Type Inequalities
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