Provably good pattern generators for a random pattern test
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Publication:1322559
DOI10.1007/BF01293265zbMath0791.94017MaRDI QIDQ1322559
Publication date: 24 July 1994
Published in: Algorithmica (Search for Journal in Brave)
68W35: Hardware implementations of nonnumerical algorithms (VLSI algorithms, etc.)
94C12: Fault detection; testing in circuits and networks
65C10: Random number generation in numerical analysis
68M15: Reliability, testing and fault tolerance of networks and computer systems
Related Items
Provably good pattern generators for a random pattern test, A simple analysis of the error probability of two-point based sampling, A combinatorial error bound for \(t\)-point-based sampling, Realistic analysis of some randomized algorithms
Cites Work
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- Generalized Bonferroni inequalities
- Methods for Proving Bonferroni Type Inequalities