Automatic test pattern generation for multiple missing gate faults in reversible circuits. Work in progress report

DOI10.1007/978-3-319-59936-6_14MaRDI QIDQ1705604zbMATH OpenOpenAlexFDO

Authors Anmol Prakash Surhonne, A. Chattopadhyay, Robert Wille

Publication date 16 March 2018

Full work available at URL https://doi.org/10.1007/978-3-319-59936-6_14

Mathematics Subject Classification ID

Networks and circuits as models of computation; circuit complexity (68Q06) Quantum gates (81P65) Quantum computation (81P68) Fault detection; testing in circuits and networks (94C12)

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(6)

• Towards VHDL-based design of reversible circuits. Work in progress report
• Test pattern generation effort evaluation of reversible circuits
• Fault diagnosis in reversible circuits under missing-gate fault model
• Efficient techniques for fault detection and location of multiple controlled Toffoli-based reversible circuit
• scientific article; zbMATH DE number 3672214 (Why is no real title available?)
• On the Fault Testing for Reversible Circuits

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