Substrate curvature due to thin film mismatch strain in the nonlinear deformation range

DOI10.1016/S0022-5096(99)00070-8zbMath0966.74048MaRDI QIDQ1976950

Lambert B. Freund

Publication date: 9 May 2000

Published in: Journal of the Mechanics and Physics of Solids (Search for Journal in Brave)

zbMATH Keywords

bifurcation; buckling; thin film; residual stress; substrate curvature; mismatch strain; layered material; finite deflections

Mathematics Subject Classification ID

74S05: Finite element methods applied to problems in solid mechanics

74G60: Bifurcation and buckling

74K35: Thin films

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Cites Work

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• Bifurcation in isotropic thin film/substrate plates
• Geometrically nonlinear stress-deflection relations for thin film/substrate systems
• STABILITY OF A BIMETALLIC DISK
• The Non-Linear Boundary Value Problem of the Buckled Plate