Geometrically nonlinear stress-deflection relations for thin film/substrate systems
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Publication:2368255
A previously developed [the authors and \textit{D. E. Fahnline}, Mater. Res. Soc. Proc. 188, 21-27 (1990)] geometrically nonlinear stress-curvature relation is expanded in this paper to allow for a less restrictive approximation of the midplane strains in a thin film/substrate system. The previous analysis is based on a minimization of the total strain energy and predicts a bifurcation in shape as the magnitude of intrinsic film stress increases. It is reviewed here and three new cases are presented.
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