Semiparametric point process modeling of blinking artifacts in PALM
DOI10.1214/21-AOAS1553zbMATH Open1498.62226arXiv2101.12285OpenAlexW4286484512MaRDI QIDQ2170406FDOQ2170406
Authors: Louis G. Jensen, David J. Williamson, Ute Hahn
Publication date: 5 September 2022
Published in: The Annals of Applied Statistics (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/2101.12285
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moment-based estimationmark correlation functionmultiple blinkingphotoactivated localization microscopysecond-order characteristicsspatiotemporal point patterns
Inference from spatial processes (62M30) Applications of statistics to biology and medical sciences; meta analysis (62P10) Point processes (e.g., Poisson, Cox, Hawkes processes) (60G55)
Cites Work
- The second-order analysis of stationary point processes
- Global envelope tests for spatial processes
- An Introduction to the Theory of Point Processes
- On Correlations of Marked Point Processes
- Statistical molecule counting in super-resolution fluorescence microscopy: towards quantitative nanoscopy
- A hidden Markov model approach to characterizing the photo-switching behavior of fluorophores
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