Drift Estimation in Sparse Sequential Dynamic Imaging, With Application to Nanoscale Fluorescence Microscopy
DOI10.1111/rssb.12128zbMath1414.62293arXiv1403.1389WikidataQ57949842 ScholiaQ57949842MaRDI QIDQ5378147
Axel Munk, Alexander K. Hartmann, Stephan F. Huckemann, Jörn Dannemann, Oskar Laitenberger, Claudia Geisler, Alexander Egner
Publication date: 12 June 2019
Published in: Journal of the Royal Statistical Society Series B: Statistical Methodology (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/1403.1389
asymptotic normality; \(M\)-estimation; registration; image registration; sparsity; semiparametrics; drift estimation; superresolution microscopy; nanoscale fluorescence microscopy
62F12: Asymptotic properties of parametric estimators
62G05: Nonparametric estimation
62H35: Image analysis in multivariate analysis
62M15: Inference from stochastic processes and spectral analysis