Dynamic XFEM-based detection of multiple flaws using an improved artificial bee colony algorithm

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Publication:2184308

DOI10.1016/j.cma.2020.112995zbMath1442.74224OpenAlexW3013368800WikidataQ114751536 ScholiaQ114751536MaRDI QIDQ2184308

Wenhu Zhao, Chengbin Du, Xiaodong Deng, Shouyan Jiang

Publication date: 28 May 2020

Published in: Computer Methods in Applied Mechanics and Engineering (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.cma.2020.112995




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