Crack identification by ‘arrival time’ using XFEM and a genetic algorithm
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Publication:3614728
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Cites work
- scientific article; zbMATH DE number 4033243 (Why is no real title available?)
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Cited in
(26)- Detection of multiple complicated flaw clusters by dynamic variable-node XFEM with a three-step detection algorithm
- Computational methods for fracture in brittle and quasi-brittle solids: state-of-the-art review and future perspectives
- Parametrized reduced order modeling for cracked solids
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- An augmented time reversal method for source and scatterer identification
- A sweeping window method for detection of flaws using an explicit dynamic XFEM and absorbing boundary layers
- Identification of a scatterer embedded in elastic heterogeneous media using dynamic XFEM
- Efficient modeling of internal cracks for Laplace problem by XFEM using Joukowski mapping
- An adaptive multiscale approach for identifying multiple flaws based on XFEM and a discrete artificial fish swarm algorithm
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- Nondestructive identification of multiple flaws using XFEM and a topologically adapting artificial bee colony algorithm
- Time reversal with partial information for wave refocusing and scatterer identification
- A divide-alternate-and-conquer approach for localization and shape identification of multiple scatterers in heterogeneous media using dynamic XFEM
- The identification of cracks using boundary elements and evolutionary algorithms
- Identification of crack parameters and stress intensity factors in finite and semi-infinite plates solving inverse problems of linear elasticity
- Detection and quantification of flaws in structures by the extended finite element method and genetic algorithms
- Cavity identification in elastic structures by explicit domain mapping and boundary mode sensitivity analysis
- XFEM-based crack detection scheme using a genetic algorithm
- On the application of peridynamics to crack detection in membranes using an upgraded metaheuristic
- Modeling and identification of an arbitrarily shaped scatterer using dynamic XFEM with cubic splines
- Combined arrival-time imaging and time reversal for scatterer identification
- Time reversal for crack identification
- Flaw classification and detection in thin‐plate structures based on scaled boundary finite element method and deep learning
- Uncertainty quantification in homogenization of heterogeneous microstructures modeled by XFEM
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