Consecutive covering arrays and a new randomness test

DOI10.1016/j.jspi.2009.11.016zbMath1279.62044MaRDI QIDQ2266901

F. S. Milienos, Anant P. Godbole, Markos V. Koutras

Publication date: 26 February 2010

Published in: Journal of Statistical Planning and Inference (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.jspi.2009.11.016

zbMATH Keywords

total variation distance; Markov chain embedding; Chen-Stein method; covering arrays; randomness test

Mathematics Subject Classification ID

62H10: Multivariate distribution of statistics

62F03: Parametric hypothesis testing

60J20: Applications of Markov chains and discrete-time Markov processes on general state spaces (social mobility, learning theory, industrial processes, etc.)

05B15: Orthogonal arrays, Latin squares, Room squares

62E17: Approximations to statistical distributions (nonasymptotic)

Related Items

Consecutive detecting arrays for interaction faults, Upper bounds on the sizes of variable strength covering arrays using the Lovász local lemma

Cites Work

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