Tolerating radiation-induced transient faults in modern processors
From MaRDI portal
Publication:2268752
DOI10.1007/S10766-009-0114-9zbMATH Open1186.68053OpenAlexW2047951735MaRDI QIDQ2268752FDOQ2268752
Authors: Xiao-Bin Li, Jean-Luc Gaudiot
Publication date: 9 March 2010
Published in: International Journal of Parallel Programming (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/s10766-009-0114-9
Recommendations
Reliability, testing and fault tolerance of networks and computer systems (68M15) Computer system organization (68M99)
Cites Work
Cited In (6)
- Fault-tolerant features in the HaL memory management unit
- On-line control flow error detection using relationship signatures among basic blocks
- Fault Tolerant Cache Schemes
- Efficient fault tolerant compilation: compress error flow to reduce power and enhance performance
- Evaluation and Mitigation of Radiation-Induced Soft Errors in Graphics Processing Units
- A generic dual core architecture with error containment
Uses Software
This page was built for publication: Tolerating radiation-induced transient faults in modern processors
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2268752)