Depth dependent resolution in electrical impedance tomography

DOI10.1515/JIIP-2017-0029zbMATH Open1432.35238arXiv1703.09540OpenAlexW3100749137MaRDI QIDQ2397877FDOQ2397877

Authors: Giovanni Alessandrini, Andrea Scapin 

Publication date: 24 May 2017

Published in: Journal of Inverse and Ill-posed Problems (Search for Journal in Brave)

Abstract: We consider the two-dimensional version of Calder`on's problem. When the D-N map is assumed to be known up to an error level $varepsilo{n}_0$, we investigate how the resolution in the determination of the unknown conductivity deteriorates the farther one goes from the boundary. We provide explicit formulas for the resolution, which apply to conductivities which are perturbations, concentrated near an interior point $q$, of the homogeneous conductivity.

Full work available at URL: https://arxiv.org/abs/1703.09540

Recommendations

• Optimal depth-dependent distinguishability bounds for electrical impedance tomography in arbitrary dimension
• On the resolving power of electrical impedance tomography
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zbMATH Keywords

resolutionelectrical impedance tomography

Mathematics Subject Classification ID

Diffraction, scattering (78A45) Biomedical imaging and signal processing (92C55) Numerical methods for inverse problems for boundary value problems involving PDEs (65N21) Boundary value problems for second-order elliptic equations (35J25) Ill-posed problems for PDEs (35R25) Inverse problems for PDEs (35R30) General theory of conformal mappings (30C35)

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Cited In (10)

• On the resolving power of electrical impedance tomography
• Partial data resolving power of conductivity imaging from boundary measurements
• Propagation and recovery of singularities in the inverse conductivity problem
• Optimal Depth-Dependent Distinguishability Bounds for Electrical Impedance Tomography in Arbitrary Dimension
• Enhancing D-bar reconstructions for electrical impedance tomography with conformal maps
• Electrical impedance tomography with deep Calderón method
• Interior decay of solutions to elliptic equations with respect to frequencies at the boundary
• Refined stability estimates in electrical impedance tomography with multi-layer structure
• Refined instability estimates for some inverse problems
• Resistivity imaging with controlled-source electromagnetic data: depth and data weighting

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