Localization of multiple faults with group control on a discrete device

DOI10.1134/S0005117917120074MaRDI QIDQ2412970zbMATH OpenOpenAlexFDO

Authors G. P. Aksenova

Publication date 6 April 2018

Published in Automation and Remote Control (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1134/s0005117917120074

zbMATH Keywords

control pointdiscrete devicefault localizationsignature analyzertesting

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Decentralized systems (93A14) Sensitivity (robustness) (93B35)

Recommendations

• Localization of faulty multi-output unit in discrete device
• Increasing resolvability for the matrix fault localization method
• A matrix method for PLD failure localization
• Disjoint spread systems and fault location
• Group testing with unreliable tests

Cites work

• A low hardware overhead self-diagnosis technique using reed-solomon codes for self-repairing chips
• A matrix method for PLD failure localization
• Increasing resolvability for the matrix fault localization method
• Localization of faulty multi-output unit in discrete device
• New Design for Testability Approach for Clock Fault Testing
• Test Point Insertion with Control Points Driven by Existing Functional Flip-Flops

Cited in

(1)

• Localization of faulty multi-output unit in discrete device

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