A marked point process perspective in fitting spatial point process models
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Publication:2427166
DOI10.1016/J.JSPI.2007.09.008zbMATH Open1134.62064OpenAlexW2019958883MaRDI QIDQ2427166FDOQ2427166
Authors: Yongtao Guan 
Publication date: 8 May 2008
Published in: Journal of Statistical Planning and Inference (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.jspi.2007.09.008
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Cited In (12)
- Spatial prediction of the mark of a location-dependent marked point process: how the use of a parametric model may improve prediction.
- Analysing Multivariate Spatial Point Processes with Continuous Marks: A Graphical Modelling Approach
- A Composite Likelihood Approach in Fitting Spatial Point Process Models
- A note on expansion for functionals of spatial marked point processes
- Functional marked point processes: a natural structure to unify spatio-temporal frameworks and to analyse dependent functional data
- A Marked Point Process for Modeling Lidar Waveforms
- Score, pseudo-score and residual diagnostics for spatial point process models
- On the Threshold Method for Marked Spatial Point Processes
- A combined estimating function approach for fitting stationary point process models
- Modelling marked point patterns by intensity-marked Cox processes
- Case studies in spatial point process modeling. Most papers based on the presentation at the international conference on spatial point process modeling and its applications, Benicàssim, Castellon, Spain, April 4--8, 2004.
- A fast spectral quasi-likelihood approach for spatial point processes
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